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X-ray fluorescence spectroscopy (XRF) is a non-destructive technique that can be used to determine barium in TiO2determination of barium as tio2 factory. This method involves bombarding the sample with X-rays and measuring the resulting fluorescence spectrum. XRF offers fast analysis times and requires minimal sample preparation, making it suitable for on-site testing. However, its accuracy may be affected by matrix effects and interference from other elements.